Monitoring of vapor uptake by refractive index and thickness measurements in thin films
نویسندگان
چکیده
منابع مشابه
Monitoring of vapor uptake by refractive index and thickness measurements in thin films.
We report a method for real-time monitoring of vapor uptake by simultaneous detection of the refractive index, n, and thickness, d, of thin transparent films with a precision of δn=10(-4) and δd<100 nm. The setup combines total internal reflection (Abbé) refractometry with an interferometric imaging method. A fast Fourier transform and phase fitting method is applied for accurate and independen...
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ژورنال
عنوان ژورنال: Optics Letters
سال: 2013
ISSN: 0146-9592,1539-4794
DOI: 10.1364/ol.38.000365